Measuring Instrument×ネッチ・ジャパン - List of Manufacturers, Suppliers, Companies and Products

Measuring Instrument Product List

1～6 item / All 6 items

Displayed results
DSC 300 Caliris / Differential Scanning Calorimeter

DSC 300 Caliris / Differential Scanning Calorimeter

The most comprehensive, reliable, and versatile material property evaluation DSC on the market!

Regardless of the type of work involved, such as research and development, quality control, contract testing, or material specifications for specific applications, information about the behavior of materials under temperature changes and different atmospheres is important. ■ Material identification ■ Process optimization ■ Quality control ■ Phase diagrams ■ Kinetic analysis ■ Miscibility *For more details, please refer to the catalog or feel free to contact us.*

  • Other analytical equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Thermal Diffusivity Measurement Device "LFA 457 MicroFlash"

Thermal Diffusivity Measurement Device "LFA 457 MicroFlash"

Supports multilayer structured samples! Thermal diffusivity measurement device based on the laser flash method.

The "LFA 457 MicroFlash" is a device that can measure the thermal properties of materials, such as thermal diffusivity and thermal conductivity. This device is designed based on the laser flash method, which is a non-contact measurement technique optimal for measuring ceramics, alloys, composite materials, and multilayer materials. It supports measurements in a temperature range of -125°C to 1100°C. The thermal diffusivity of standard sample materials can be measured with an accuracy of ±3%, and for specific heat capacity, most materials can be measured within ±5%, allowing for high-precision measurements. 【Features】 ■ Short measurement time ■ Non-destructive testing, non-contact measurement ■ Wide measurement range ■ High precision, high reproducibility ■ Compatible with multilayer materials *For more details, please refer to the catalog or feel free to contact us.

  • Other analytical equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
NanoTR・PicoTR / Thin Film Thermal Property Measurement Device

NanoTR・PicoTR / Thin Film Thermal Property Measurement Device

The only device capable of measuring the thermal properties of thin films on the nanometer order.

The NanoTR and PicoTR thin film thermal property measurement devices are the world's first instruments capable of accurately measuring the thermal properties of metal films, oxide films, and organic films. 【Features】 ■ Capable of measuring thermal diffusivity, thermal conductivity, and interfacial thermal resistance of thin films with thicknesses ranging from several tens of nanometers to several micrometers. ■ Equipped with both RF and FF measurement methods, allowing measurements regardless of the type of substrate. ■ SI traceable device, compliant with JIS R 1689 and JIS R 1690. *For more details, please refer to the catalog or feel free to contact us.

  • Other analytical equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
LFA 467 HyperFlash / Thermal Conductivity Measurement Device

LFA 467 HyperFlash / Thermal Conductivity Measurement Device

Light Flash Analyzer for Thermal Diffusivity (Thermal Conductivity) Measurement Device.

The latest tabletop Xe flash analyzer enables rapid, easy, and highly accurate measurement of thermal diffusivity and thermal conductivity. It covers a wide measurement temperature range from -100°C to 1250°C, and with improved pulse width, it can also handle high thermal conductivity samples of thin films that were difficult to measure conventionally. It comes standard with a maximum of 16 auto-sample changers, allowing for highly accurate measurements of samples ranging from large diameters to very small diameters.

  • Other analytical equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
HFM 446 Lambda / Thermal Conductivity Measurement Device for Insulation Materials

HFM 446 Lambda / Thermal Conductivity Measurement Device for Insulation Materials

Devices that enable energy conservation and efficient use.

The HFM 446 Lambda is a thermal conductivity measurement device suitable for measuring the thermal conductivity of materials with low conductivity, such as insulation materials. The sample is placed between a hot plate and a cold plate, and the temperature difference is adjusted while the heat flux is measured with sensors. Stability is achieved in about 15 minutes, allowing for more measurements and increased productivity. With two heat flux sensors positioned, the error remains below 0.5% within 15 minutes, and during tests lasting several days, a very stable conductivity of 0.10 to 0.25% can be obtained. This allows for reliable data collection for simple inspections of product variability during the manufacturing process. 【Features】 ■ High precision, stability, and accuracy ■ Fast and easy operation ■ Automatic operation ■ Short setup time and quick start *For more details, please refer to the catalog or feel free to contact us.

  • Other analytical equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Seebeck coefficient and electrical conductivity simultaneous measurement device

Seebeck coefficient and electrical conductivity simultaneous measurement device

Maximum measurement temperature 1100℃! Significant reduction in sample shape constraints! Rapid and accurate evaluation.

The "SBA 458 Nemesis" is a measurement device that can measure the Seebeck coefficient and electrical conductivity (1/Ωm) under identical conditions up to 1100°C. It accommodates various sample shapes, including square, rectangular, circular, and strip shapes. Sample exchange can be performed quickly and easily without the need for fixtures. Additionally, the double heater allows for the setting of any temperature gradient at each measurement temperature step. The appropriateness of the measurement can be verified by examining the deviation from the linear response when the temperature gradient is changed before and during the measurement, as well as checking for hysteresis. 【Features】 ■ Capable of measuring samples of various shapes ■ Immediate measurement start – easy sample exchange ■ Data verification function – double heater mechanism ■ Highly reliable short needle structure – solves solid diffusion problems ■ No need to measure the distance between short needles *For more details, please refer to the catalog or feel free to contact us.

  • Other analytical equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Search Keywords Related to Measuring Instrument

COPYRIGHT © 2001-2025 IPROS CORPORATION ALL RIGHTS RESERVED.